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Total Reflection X-Ray Fluorescence Spectrometer
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  • It is a non destructive tool, does not require standards.
  • It can simultaneously analyze elements ranging from Na to 92U.
  • It is a very rapid method with determination time from 10 seconds to 1000 seconds.
  • The lowest absolute detection limit is pg level; the lowest relative detection limit is ng/ml.
  • Consumption of samples is very low - ÁL or NG level.
  • Excitation power is less than 500 W.
  • Powder, Suspending liquid & the sample that could provide a plane could by directly determined without pretreatment. The low detection limit for which is ng/g level.
Total Reflection X-Ray Fluorescence Spectrometer
 
 
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